WebThe Flexus stress measurement systems come in two versions: FLX-2320 for sample sizes 25 mm – 200 mm and FLX-3300 for sample sizes up to 300 mm. Specifications Maximum Scan Diameter/Sample Size 50-200 mm for the FLX-2320 (1 inch on request) 75-300 mm for the FLX-3300 Performance Measurement Range: 1 to 4000 MPa1 (3500 MPa for the FLX … WebApr 13, 2004 · The Toho FLX-2320 is a thin film stress machine. A laser scanner is used to measure the changes in the radius of curvature of the substrate caused by the deposition …
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WebDec 19, 2024 · Overview A Toho/KLA-Tencor FLX Series Wafer Stress Measurement System, the Toho FLX-2320-S is an easy to use tool for the measurement of thin film stress utilizing the wafer curvature technique as measured by either a 670 nm or a 780 nm laser. WebThin Film Stress Measurement (FLX 2320) TOF-SIMS Imaging Spectrometer (ION-TOF GmbH) TPT HB16 Wire bonder; Tystar Doped Anneal; Tystar General Anneal; Tystar … cassinin käyrä
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WebToho FLX-2320-S Thin Film Stress Measurement Systems offer industry standard capabilities for serial and research installations that require precise strain measurements on various films and substrates up to 200 mm in diameter. WebToho FLX-2320-R Thin Film Stress Measurement Systems offer industry standard capabilities for mass production and research facilities that demand accurate stress … WebPart Number 6898. Display temperature and activate audible and visual alarms to warn of overtemperature and power failure. Features Temperature range of -100° to +25°C, 8-foot … cassini jacket